GB/T 14849.5-2014
ActiveMethods for chemical analysis of silicon metal―Part 5：Determination of impurity contents―X-ray fluorescence method
工业硅化学分析方法 第5部分：杂质元素含量的测定 X射线荧光光谱法
Application Summary AI generated
This standard specifies the X-ray fluorescence spectrometry method for determining impurity element content in silicon metal. It is applied in the metallurgical industry for quality control and chemical analysis of industrial silicon, particularly for assessing elements like iron, aluminum, and calcium in silicon metal products. The method is used by testing laboratories and manufacturers to ensure compliance with material specifications for applications such as solar-grade silicon and aluminum-silicon alloys.
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